Automatic Image Registration and Defect Identification of a Class of Structural Artifacts in Printed Documents

I understand that I must submit a print copy of my thesis or dissertation to the RIT Archives, per current RIT guidelines for the completion of my degree. I hereby grant to the Rochester Institute of Technology and its agents the non-exclusive license to archive and make accessible my thesis or dissertation in whole or in part in all forms of media in perpetuity. I retain all other ownership rights to the copyright of the thesis or dissertation. I also retain the right to use in future works (such as articles or books) all or part of this thesis or dissertation. Digital Media Library (RIT DML) the non-exclusive license to archive and provide electronic access to my thesis or dissertation in whole or in part in all forms of media in perpetuity. I understand that my work, in addition to its bibliographic record and abstract, will be available to the worldwide community of scholars and researchers through the RIT DML. I retain all other ownership rights to the copyright of the thesis or dissertation. I also retain the right to use in future works (such as articles or books) all or part of this thesis or dissertation. I am aware that the Rochester Institute of Technology does not require registration of copyright for ETDs. I hereby certify that, if appropriate, I have obtained and attached written permission statements from the owners of each third party copyrighted matter to be included in my thesis or dissertation. I certify that the version I submitted is the same as that approved by my committee. DEDICATION To my parents, family and friends. IV ACKNOWLEDGMENTS I extend my utmost gratefulness to Dr. Eli Saber, my thesis advisor, for making this thesis possible, providing valuable advice and supporting my research. I would also like to thank Dr. Wencheng Wu, Xerox Corporation, Webster, NY from whom I have gained an appreciable knowledge in image quality procedures and guidelines. Special thanks to Dr. Daniel Phillips and Dr. Sohail Dianat for being a part of my committee and providing helpful comments and questions that helped improve this thesis. Many thanks to my colleagues Mr. Department at the Rochester Institute of Technology supported this project and created the opportunity to explore this field. Finally, I would like to recognize my family for the unconditional support they gave me throughout the years. ABSTRACT The work in this thesis proposes a defect …